[Gemini]<\/p>\n\n\n\n
In the semiconductor world, STDF (Standard Test Data Format)<\/strong> is the universal language of test results. Developed by Teradyne, it is a binary file format used to store data generated by Automatic Test Equipment (ATE) during the wafer sort and final package testing phases.<\/p>\n\n\n\n Think of it as the “black box” recorder for microchips. Every time a chip is tested, the ATE records whether it passed, its voltage readings, timing measurements, and binning information into an STDF file for later analysis.<\/p>\n\n\n\n An STDF file isn’t human-readable if you open it in Notepad. It consists of a sequence of variable-length records. A simplified logical flow looks like this:<\/p>\n\n\n\n Since STDF is binary, you don’t want to write a parser from scratch. The most popular tool for this is the Here is a short example using a typical parsing approach to extract Parametric Test Results (PTR)<\/strong>:<\/p>\n\n\n\nWhy Use STDF?<\/h2>\n\n\n\n
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Example of STDF Record Logic<\/h2>\n\n\n\n
Record Type<\/strong><\/td> Name<\/strong><\/td> Purpose<\/strong><\/td><\/tr><\/thead> MIR<\/strong><\/td> Master Information Record<\/td> Setup info: Lot ID, Operator, Node Name, Start Time.<\/td><\/tr> PIR<\/strong><\/td> Part Information Record<\/td> Marks the beginning of a specific chip (part) being tested.<\/td><\/tr> PTR<\/strong><\/td> Parametric Test Record<\/td> The “meat”: Test name, actual value (e.g., 1.25V), limits, and pass\/fail status.<\/td><\/tr> PRR<\/strong><\/td> Part Results Record<\/td> The “summary” for that chip: Final bin, total test time, and pass\/fail flag.<\/td><\/tr> MRR<\/strong><\/td> Master Results Record<\/td> The end of the file: Total parts tested and finish time.<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n How to Handle STDF (Python Example)<\/h2>\n\n\n\n
pystdf<\/code> library or semi-ate<\/code>.<\/p>\n\n\n\n