Yield-Aware Memory Cell Development

  • Developed statistical yieldโ€‘aware models for the SRAM bitโ€‘cell and array, known as the Zโ€‘score method, and built an HSPICE/Perl/Motifโ€‘based simulator called Zimulator.
  • Published a tutorial book on the yield-aware statistical SRAM bit-cell design method. A portion of it is included below.
  • Presented my work on statistical SRAM bitโ€‘cell design technology at the 2008 VLSI Symposium Tutorial. The full slides are available below.
  • Achieved earlyโ€‘stage yield rampโ€‘up, driven primarily by SRAMโ€‘macro yield, and delivered recordโ€‘breaking yield at Samsung Foundry.
  • Investigated 3D transistor structures and SRAM cell architectures enabled by waferโ€‘bonding technology.

Statistical SRAM Design (SSD)

2008 VLSI Technology Short Course, June 16, 2008

2008 VLSI Technology Short Course Brochure

Small-Circuit Compact Modeling


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